Method and apparatus for locating critical speed paths in integr

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

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714724, G01R 3128

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active

060528117

ABSTRACT:
A method and apparatus for locating a critical speed path in an integrated circuit. The apparatus comprises a plurality of controllable clock drivers each coupled to a circuit block of the integrated circuit. The apparatus also comprises a plurality of clocked storage devices each coupled to one of the controllable clock drivers and including a clock input, a data input and a data output. Test circuitry that operates with joint test action group (JTAG) compatible protocol is coupled to the plurality of clocked storage devices and generates a signal that controls the plurality of controllable clock drivers.

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