Method and apparatus for logic testing an integrated circuit

Details Method and apparatus for logic testing an integrated circuit Method and apparatus for logic testing an integrated circuit

1998-02-20

2000-02-29

Tu, Trinh L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714 33, G01R 3128

Patent

active

060322772

ABSTRACT:
An event driven system for testing logical operations of logic elements of an integrated circuit including an oscillation element. The system uses in/out data of the logic elements and net-list data of the logic circuit. An incoming event of the oscillator element has a signal incoming time and a signal incoming place, indicating a change in a signal by oscillation of the oscillation element. An incoming process of the incoming event includes generating a normal event having the same incoming time and the same incoming place as the incoming event, and generating a new incoming event having the same incoming time as the incoming event, but a different incoming time. The different incoming time is a changing time of a signal caused by oscillation of the oscillator element. The changing time is later than the incoming time of the incoming event.

REFERENCES:
patent: 5212443 (1993-05-01), West et al.
patent: 5477139 (1995-12-01), West et al.

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