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Method for testing a controller with random constraints

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing a current mode interpolator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing a memory array

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing a semiconductor integrated circuit when a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing an electronic circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing an electronic circuit comprising a test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing asynchronous circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing at least one arithmetic unit installed in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing chip configuration settings

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing circuit design using exhaustive test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing circuit units to be tested by means of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing circuit units to be tested with increased...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing circuits with tri-state drivers and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing damaged integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing embedded DRAM arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing faults in a programmable logic device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing field programmable gate arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Method for testing field programmable gate arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Method for testing for the presence of faults in digital...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing functional circuit block

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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