Method for testing circuit units to be tested by means of...

Details Method for testing circuit units to be tested by means of... Method for testing circuit units to be tested by means of...

2006-11-28

2006-11-28

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000, C714S734000

Reexamination Certificate

active

07143325

ABSTRACT:
The invention provides a test device for testing circuit units (101a–101n) to be tested, having connecting units (106a–106n) for connecting the circuit units (101a–101n) to be tested to the test device, a test system (100) and an output unit (108) for outputting test result data, the test device having a determining unit (103) for determining those of the measurement data (110a–101n) which correspond for a predeterminable number of circuit units (101a–101n) to be tested, and for defining the corresponding measurement data (110a–110n) as the expected data (111); and comparison units (104a–104n) for comparing the measurement data (110a–110n) generated by the circuit units (101a–101n) to be tested in a manner dependent on the test data (112) written in with the expected data (111) in order to obtain comparison data (115a–115n).

REFERENCES:
patent: 6480978 (2002-11-01), Roy et al.
patent: 6559671 (2003-05-01), Miller et al.
patent: 2001/0025227 (2001-09-01), Ajiro
patent: 2002/0133774 (2002-09-01), Inoue
patent: 2003/0071649 (2003-04-01), Dankowski et al.
patent: 101 50 441 (2003-04-01), None

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