Method for adding scan controllability and observability to...
Method for analyzing manufacturing test pattern coverage of...
Method for application of weighted random patterns to partial sc
Method for automated at-speed testing of high serial pin...
Method for automated at-speed testing of high serial pin...
Method for automatically searching for and sorting failure...
Method for automating validation of integrated circuit test...
Method for blocking unknown values in output response of...
Method for built-in self test of an electronic circuit
Method for capturing digital data in an automatic test system
Method for clustered test pattern generation
Method for concurrent testing of on-chip circuitry and timing co
Method for correcting data using temporally preceding data
Method for cost-effective production testing of input voltage le
Method for detecting a malfunction in a state machine
Method for detecting faults in electronic devices, based on...
Method for detecting faults in electronic devices, based on...
Method for detecting software errors and vulnerabilities
Method for detecting software errors and vulnerabilities
Method for determining integrity of memory