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Method for adding scan controllability and observability to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for analyzing manufacturing test pattern coverage of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for application of weighted random patterns to partial sc

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Method for automated at-speed testing of high serial pin...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for automated at-speed testing of high serial pin...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for automatically searching for and sorting failure...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for automating validation of integrated circuit test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for blocking unknown values in output response of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for built-in self test of an electronic circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for capturing digital data in an automatic test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Method for clustered test pattern generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for concurrent testing of on-chip circuitry and timing co

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for correcting data using temporally preceding data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for cost-effective production testing of input voltage le

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Method for detecting a malfunction in a state machine

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for detecting faults in electronic devices, based on...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for detecting faults in electronic devices, based on...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for detecting software errors and vulnerabilities

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for detecting software errors and vulnerabilities

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for determining integrity of memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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