Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-02-20
2009-02-24
Abraham, Esaw T (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000, C365S201000, C324S210000, C324S073100, C360S026000, C360S047000, C360S053000, C377S073000
Reexamination Certificate
active
07496817
ABSTRACT:
A method for testing the integrity of a memory with defective sections under a plurality of operating environments includes testing the memory with defective sections under a plurality of operating environments, recording results of each operating environment test, and comparing the results of the tests. If the results of are the same, the memory with defective sections is declared to have integrity. If not, the memory with defective sections is declared to not have integrity.
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Liu Po-Wei
Wu Chang-Lien
Abraham Esaw T
Hsu Winston
Realtek Semiconductor Corp.
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