Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-01-01
2008-01-01
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S025000, C702S064000, C324S523000
Reexamination Certificate
active
07315974
ABSTRACT:
The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current IDDQ, to said device, wherein each IDDQmeasured value is divided by another IDDQvalue, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.
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De Pauw Piet
Manhaeve Hans
Lamarre Guy
Merchant & Gould P.C.
Q-Star Test N.V.
Trimmings John P.
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