Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-09-30
2008-09-30
Tu, Christine T. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S741000, C703S013000
Reexamination Certificate
active
11670031
ABSTRACT:
The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.
REFERENCES:
patent: 5233337 (1993-08-01), Takahashi
patent: 6128754 (2000-10-01), Graeve et al.
patent: 6658604 (2003-12-01), Corbin et al.
LSI Logic Corporation
Trexler Bushnell Giangiorgi & Blackstone Ltd.
Tu Christine T.
LandOfFree
Failure analysis and testing of semi-conductor devices using... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Failure analysis and testing of semi-conductor devices using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Failure analysis and testing of semi-conductor devices using... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3916037