Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-03-29
2005-03-29
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S734000, C716S030000
Reexamination Certificate
active
06874112
ABSTRACT:
An integrated circuit with improved testability includes a test logic component that replaces a corresponding regular logic component and that generates a logic high or low whenever a test input is activated. Alternatively, it may generate either high or low depending on which of two test inputs is activated. A test program may be augmented with instructions to activate such test inputs. An integrated circuit design may be analyzed to select a node that is not covered by a test program and to identify which logic component generates an output on the node. Then the design may be altered to replace the identified logic component with a corresponding test logic component. Test coverage analysis may be based on determining whether the test program toggles the node, or determining whether a stuck at fault on the node propagates so as to be observed.
REFERENCES:
patent: 6195776 (2001-02-01), Ruiz et al.
patent: 6311318 (2001-10-01), Souef et al.
patent: 6363509 (2002-03-01), Parulkar et al.
patent: 6671870 (2003-12-01), Souef et al.
Fernandez & Associates LLP
Summit Microelectronics Inc.
Tu Christine T.
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