Failure isolation and repair techniques for integrated circuits

Details Failure isolation and repair techniques for integrated circuits Failure isolation and repair techniques for integrated circuits

2006-09-19

2006-09-19

Lamarre, Guy (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S005110, C714S010000, C714S711000

Reexamination Certificate

active

07111213

ABSTRACT:
Techniques for isolating and repairing failures on a programmable circuit are provided. An error on programmable circuit may be caused by a defect on the chip. The error is located, and the circuit elements effected by the defect are isolated. By identifying operable circuit elements near the defect, the number of circuit elements that are adversely effected by the defected can be narrowed down. The failed circuit elements adversely effected by the defect are then shut down and cut off from the rest of the programmable circuit. The functionality performed by the failed circuit elements is transferred to an unused portion of the programmable circuit. The se techniques reduce the amount of circuit elements that need to be shut down as a result of a defect on a programmable circuit.

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