Failure analysis and testing of semi-conductor devices using...

Details Failure analysis and testing of semi-conductor devices using... Failure analysis and testing of semi-conductor devices using...

2007-04-10

2007-04-10

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

11028695

ABSTRACT:
The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.

REFERENCES:
patent: 5497379 (1996-03-01), Whetsel
patent: 6473707 (2002-10-01), Grey
patent: 6539497 (2003-03-01), Swoboda et al.

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