Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-02-27
2007-02-27
Chung, Phung My (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S736000, C360S027000, C360S053000
Reexamination Certificate
active
10621603
ABSTRACT:
A failure analysis system of a logic LSI incorporates software therein. The analysis system includes a function to record the terminal signal information of said logic LSI in synchronization with a clock and a function to reproduce said recorded terminal signal information in synchronization with the clock. The analysis system further includes a function to compare said reproduced terminal signal information with the terminal signal information of a normal logic LSI.
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patent: 05-334120 (1993-12-01), None
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patent: 2001-249823 (2001-09-01), None
Chung Phung My
Oki Electric Industry Co. Ltd.
Volentine & Whitt P.L.L.C.
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