Failure analysis device for IC tester and memory device measurin

Details Failure analysis device for IC tester and memory device measurin Failure analysis device for IC tester and memory device measurin

1998-04-14

1999-11-02

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

365201, G01R 3128, G11C 700

Patent

active

059789492

ABSTRACT:
A failure analysis device of the present invention performs a simple and quick failure analysis of a memory device. The failure analysis device for an IC tester analyzes failure data received from a memory device and comprises a memory and a selector. The memory stores the failure data. The selector optionally selects an address to which the failure data is written. The selectors connect the address with an address of the memory and output the failure data to the memory.

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patent: 5835428 (1998-11-01), Kobayashi
patent: 5841785 (1998-11-01), Suzuki

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