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Circuit for boosting encoding capabilities of test stimulus...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit for checking a tristate detection circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for compression and storage of circuit diagnosis data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for control and observation of a scan chain

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for controlling voltage fluctuation in integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for easily testing a logic circuit having a number of in

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Circuit for efficiently testing memory and shadow logic of a sem

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Circuit for evaluating signal timing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Circuit for PLL-based at-speed scan testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for PLL-based at-speed scan testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for testing power down reset function of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for testing power down reset function of an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit including a built-in self-test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit scan output arrangement

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit state scan-chain, data collection system and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit structure for testing microprocessors and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit test pattern edition apparatus, circuit test pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit testing with ring-connected test instrument modules

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit testing with ring-connected test instrument modules

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit timing monitor having a selectable-path ring oscillator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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