Circuit for testing power down reset function of an...

Details Circuit for testing power down reset function of an... Circuit for testing power down reset function of an...

2008-07-22

2008-07-22

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S500000

Reexamination Certificate

active

07404119

ABSTRACT:
A circuit for testing a power down reset function of an electronic device includes a reference power source (Vref), a first variable resistor (R1) with one end connected to the reference power source, a second variable resistor (R2), and a jumper (10). One end of the second variable resistor is connected to the other end of the first variable resistor, and the other end of the second variable resistor is grounded. The jumper includes four pins, with a first pin (101) connected to a node (B) between the first variable resistor and the second variable resistor, a third pin (103) grounded, and a second pin (102) and a fourth pin (104) commonly connected to a voltage testing pin (20) of an electronic device (2). The circuit is simple, is conveniently operated, and saves costs.

REFERENCES:
patent: 4471418 (1984-09-01), Tuma
patent: 5047987 (1991-09-01), Kosuge
patent: 5105373 (1992-04-01), Rumsey et al.
patent: 5450417 (1995-09-01), Truong et al.
patent: 6943596 (2005-09-01), Slamowitz et al.
patent: 2001/0020670 (2001-09-01), Hyoga et al.
patent: 2003/0236928 (2003-12-01), Wang et al.

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