Circuit for boosting encoding capabilities of test stimulus...

Details Circuit for boosting encoding capabilities of test stimulus... Circuit for boosting encoding capabilities of test stimulus...

2011-04-19

2011-04-19

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07930607

ABSTRACT:
The circuit for boosting encoding capabilities of test stimulus decompressors is utilized in conjunction with a stimulus decompressor. The circuit, called align-encode is inserted between the decompressor and internal. The scan chains feed into a response compactor. The align-encode circuit is used to judiciously manipulate care bit distribution. Re-configurability of the align-encode circuit allows for this manipulation via delay cells with the align-encode circuit, whose length can be adjusted on a per scan chain per test pattern basis by loading the align-encode circuit with proper control data. Based on the stimulus decompressor characteristics, the scan chains are delayed in such a way that an unencodable pattern becomes encodable when using the align-encode circuit.

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