Circuit for control and observation of a scan chain

Details Circuit for control and observation of a scan chain Circuit for control and observation of a scan chain

2007-11-20

2007-11-20

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S727000

Reexamination Certificate

active

10281973

ABSTRACT:
A circuit for control and observation of a scan chain. The circuit comprises a group of first scan cells connected in series, receiving a first data signal and outputting a second data signal, a multiplexer receiving the first and second data signal, and selectively outputting the first and second data signal in response to a selection signal, and a group of second scan cells connected in series, receiving the first or second data signal from the multiplexer, and outputting a third data signal.

REFERENCES:
patent: 5329533 (1994-07-01), Lin
patent: 5448575 (1995-09-01), Hashizume
patent: 5450414 (1995-09-01), Lin
patent: 5726998 (1998-03-01), Ozaki
patent: 5925143 (1999-07-01), Gillis et al.
patent: 6370664 (2002-04-01), Bhawmik
patent: 6615380 (2003-09-01), Kapur et al.

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