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Circuit and method for testing embedded phase-locked loop...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method for testing physical layer functions of a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method for testing semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method providing dynamic scan chain partitioning

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method to prevent inadvertent test mode entry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method to prevent inadvertent test mode entry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method to prevent inadvertent test mode entry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and/or method for automated use of unallocated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit apparatus and method for testing integrated circuits...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit arrangement and method for checking the function of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit arrangement and method for driving electronic chips

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit arrangement and method for driving electronic chips

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit arrangement and method of testing an application...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit arrangement, electronic mechanism, electrical turn...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit cell for test pattern generation and test pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit cell having a built-in self-test function, and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit configuration with deactivatable scan path

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for and method of determining the location of a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for and method of determining the location of a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit for and method of implementing programmable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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