Circuit and method for testing embedded phase-locked loop...
Circuit and method for testing physical layer functions of a...
Circuit and method for testing semiconductor device
Circuit and method providing dynamic scan chain partitioning
Circuit and method to prevent inadvertent test mode entry
Circuit and method to prevent inadvertent test mode entry
Circuit and method to prevent inadvertent test mode entry
Circuit and/or method for automated use of unallocated...
Circuit apparatus and method for testing integrated circuits...
Circuit arrangement and method for checking the function of...
Circuit arrangement and method for driving electronic chips
Circuit arrangement and method for driving electronic chips
Circuit arrangement and method of testing an application...
Circuit arrangement, electronic mechanism, electrical turn...
Circuit cell for test pattern generation and test pattern...
Circuit cell having a built-in self-test function, and test...
Circuit configuration with deactivatable scan path
Circuit for and method of determining the location of a...
Circuit for and method of determining the location of a...
Circuit for and method of implementing programmable logic...