Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent
1997-06-26
1999-08-31
Tu, Trinh L.
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
G01R 3128
Patent
active
059448458
ABSTRACT:
A test vector decode circuit includes a lockout circuit to prevent inadvertent latching of output vectors. This circuit is driven by an additional output vector from the circuit. The additional output vector, as well as the other output vectors, undergo at least one latching. The signal transmitted by the additional output vector as a result of the final latching activates the lockout circuit. The test vector decode circuit also receives a supervoltage signal. Only by turning off the supervoltage signal can all of the output test vectors be reset, including the additional output vector.
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Brantley Charles
Micro)n Technology, Inc.
Tu Trinh L.
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