Circuit arrangement and method for checking the function of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S733000

Reexamination Certificate

active

07996742

ABSTRACT:
A circuit arrangement comprising a logic circuit to be tested and a test circuit. The logic circuit comprising logic-circuit-internal combinations configured to generate output data from input data based on a predetermined relationship. The logic circuit is configured to detect whether the relationship is satisfied and to provide an error signal if the relationship is not satisfied. The test circuit is configured to alter logic-circuit-internal combinations, to detect the error signal, and to output an alarm signal if the error signal is not detected upon alteration of the logic-circuit-internal combinations.

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patent: 10 2006 001 872 (2007-07-01), None
patent: 10 2006 001 873 (2007-07-01), None

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