Circuit apparatus and method for testing integrated circuits...

Details Circuit apparatus and method for testing integrated circuits... Circuit apparatus and method for testing integrated circuits...

2006-07-18

2006-07-18

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S739000

Reexamination Certificate

active

07080298

ABSTRACT:
A method for testing an electronic circuit includes selecting an input signal using a first multiplexer, selecting a signal to be input to the first multiplexer using at least one other multiplexer, and controlling the at least one other multiplexer using a selection signal output from a control circuit.

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M. Morris Mano, “Computer System Architecture”, 2ndedition, Prentice-Hall, Inc., NJ, 1982, pp. 53-54.

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