ABIST data compression and serialization for memory built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S736000, C714S718000

Reexamination Certificate

active

11054566

ABSTRACT:
A method and apparatus for implementing ABIST data compression and serialization for memory built-in self test of SRAM with redundancy. The method includes providing detection signals asserted for one failing data out, two failing data outs, and greater than two failing data outs. The method also includes individually encoding the failing bit position of each corresponding failing data out with a binary representation value corresponding therewith. The method further includes serializing results of the providing detection signals and the individually encoding, and transmitting results of the serializing to a redundancy support register function on a single fail buss.

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U.S. Appl. No. 10/814,719, filed on Mar. 31, 2004.
U.S. Appl. No. 11/053,812, filed on Feb. 9, 2005.

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