Accessing sequential data in a microcontroller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S718000, C714S726000, C714S729000, C324S762010, C324S762020, C324S762030, C324S762050, C365S201000

Reexamination Certificate

active

08055963

ABSTRACT:
System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

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Ashfield, E. et al., “Serial Wire Debug and the CoreSight™ Debug and Trace Architecture”, ARM Ltd, Cambridge, UK, 8 pages.

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