AC coupled line testing using boundary scan test methodology

Details AC coupled line testing using boundary scan test methodology AC coupled line testing using boundary scan test methodology

2007-09-11

2007-09-11

Lamarre, Guy (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

11654291

ABSTRACT:
An AC boundary scan cell is disclosed. For one embodiment the AC boundary scan cell includes a first multiplexer, a second multiplexer, a first data shift register, a second data register, an XOR logic gate, and a third multiplexer. For one such embodiment the AC boundary scan cell includes an SDI line, an SDO line, a TDI line, a TDO line, a ShiftDR signal input line, an AC_Pattern_Clock or ClockDR signal input line, an UpdateDR signal input line, and a Mode signal input line. The AC boundary scan cell also includes an AC_Pattern_Source signal input line and an AC_Test signal input line. For one such embodiment, each line is coupled to receive the corresponding signal from the boundary scan logic.

REFERENCES:
patent: 4428060 (1984-01-01), Blum
patent: 4771428 (1988-09-01), Acuff et al.
patent: 4994732 (1991-02-01), Jeffrey et al.
patent: 5027353 (1991-06-01), Jarwala et al.
patent: 5029166 (1991-07-01), Jarwala et al.
patent: 5072178 (1991-12-01), Matsumoto
patent: 5130988 (1992-07-01), Wilcox et al.
patent: 5166937 (1992-11-01), Blecha, Jr.
patent: 5172377 (1992-12-01), Robinson et al.
patent: 5260649 (1993-11-01), Parker et al.
patent: 5321701 (1994-06-01), Raymond et al.
patent: 5444715 (1995-08-01), Gruetzner et al.
patent: 5497378 (1996-03-01), Amini et al.
patent: 5513188 (1996-04-01), Parker et al.
patent: 5691991 (1997-11-01), Kessler et al.
patent: 5760596 (1998-06-01), Peiffer et al.
patent: 5790479 (1998-08-01), Conn
patent: 5991521 (1999-11-01), Gabele et al.
patent: 6029261 (2000-02-01), Hartmann
patent: 6199182 (2001-03-01), Whetsel
patent: 6219811 (2001-04-01), Gruetzner et al.
patent: 6286119 (2001-09-01), Wu et al.
patent: 6622108 (2003-09-01), De Jong et al.
patent: 6813737 (2004-11-01), Srinivasaiah et al.
patent: 6877121 (2005-04-01), Srinivasaiah et al.
Jacobson, Neil G., “Using the Internet to repair hardware in the field”,International IC—Taipei—Conference Proceedings, pp. 76-80.
Whetsel, Lee, “Adapting JTAG for AC Interconnect Testing”, IEEE, pp. 641-650 (2003).

Affiliated with

Also associated with

Rating

AC coupled line testing using boundary scan test methodology does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with AC coupled line testing using boundary scan test methodology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and AC coupled line testing using boundary scan test methodology will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3772465