Accurately identifying failing scan bits in compression...

Details Accurately identifying failing scan bits in compression... Accurately identifying failing scan bits in compression...

2008-11-05

2011-12-27

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000, C714S732000

Reexamination Certificate

active

08086923

ABSTRACT:
X-masking registers are added in front of a compactor in test data compression environment to remove unknown values. The X-masking registers block out some chains due to unknown values and select other chains to feed the compactor. This X-masking capability is used to select one scan cell to observe at a time after a failure is observed at the compactor output.

REFERENCES:
patent: 6557129 (2003-04-01), Rajski et al.
patent: 7058869 (2006-06-01), Abdel-Hafez et al.
patent: 7222277 (2007-05-01), Wang et al.
patent: 7376875 (2008-05-01), Hilgendorf et al.
patent: 7415678 (2008-08-01), Gizdarski
patent: 7523370 (2009-04-01), Keller
patent: 7729884 (2010-06-01), Huang et al.
patent: 2003/0229886 (2003-12-01), Hasegawa et al.
patent: 2006/0111873 (2006-05-01), Huang et al.
patent: 2008/0092003 (2008-04-01), Khoche et al.
patent: 2008/0313513 (2008-12-01), Gizdarski
Khoche, D. Chindamo, M. Braun, and M. Fischer, “Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics,” Proceedings of International Test Conference, Oct. 2006, paper 8.1.
D. Josephson, S. Poehhnan, and V. Govan, “Debug Methodology for the McKinley Processor,” Proceedings of International Test Conference, Oct. 30, 2001.
D. Josephson, “The Manic Depression of Microprocessor Debug,” Proceedings of International Test Conference, Dec. 2002, pp. 657-663.
C. Pyron, R. Bangalore, D. Belete, J. Goertz, A. Razdan, and D. Younger, “Silicon Symptoms to Solutions: Applying Design for Debug Techniques,” Proceedings of International Test Conference, Dec. 2002, pp. 664-672.
Barnhart, V. Brunkhorst, F. Distler, O. Farnsworth, and B. Kellor, “OPMISR: The Foundation of Compressed ATPG Vectors,” Proceedings of International Test Conference, Oct. 20, 2001.
J. Rajski, M. Kassab, N. Mukherjee, N. Tamarapalli, J. Tyszer and J. Qian, “Embedded deterministic test for Low-cost manufacturing,” IEEE Design and Test of Computers, vol. 20, Issue 5, pp. 58-66, Sep.-Oct. 2003.
P. Wohl, J. A. Waicukauski, S. Patel and M. Amin, “Efficient Compression and Applications of Deterministic Patterns in A Logic BIST Architectures,” Proceedings of Design Automation Conference, Jun. 2, 2003, pp. 566-569.
J. Rajski, J. Tyszer, G. Mrugalski, W.-T. Cheng, N. Mukherjee, and M. Kassab, “X-Press Compactor for 1000x Reduction of Test Data,” Proceedings of International Test Conference, Oct. 2006, pp. 1-10.
Vallett, and J. Soden, “Finding Fault with Deep Sub-Micrometer ICs,” IEEE Spectrum, Oct. 1997.
W. Huott, M. Mcmanus, D. Knebel, S. Steen, D. Manzer, P. Sanda, S. Wilson, Y. Chan, A. Pelella and S. Polonsky, “The Attack of the ‘Holey Shmoos’: A Case Study of Advanced DFD and Picosecond Imaging Circuit Analysis (PICA),” Proceedings of International Test Conference, Sep. 28, 1999.
S. Mitra and K. Kim, “X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction,” Proceedings of International Test Conference, Oct. 7, 2002.
J. H. Patel, S. S. Lumetta, S. M. Reddy, “Application of Saluja-Karpovsky compactors to test responses with many unknowns,” Proceedings of VLSI Test Symposium, Apr. 27, 2003, pp. 107-112.
J. Rajski, J. Tyszer, C. Tang and S.M. Reddy, “Convolutional Compaction of Test Responses,” Proceedings of International Test Conference, Sep. 30, 2003.
P. Wohl, J. A. Waicukauski, and S. Ramnath, “Fully X-tolerant Combinational Scan Compression,” International Test Conference, Oct. 21, 2007, paper 6.1.

Affiliated with

Also associated with

Rating

Accurately identifying failing scan bits in compression... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Accurately identifying failing scan bits in compression..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Accurately identifying failing scan bits in compression... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4270801