ABIST-assisted detection of scan chain defects

Details ABIST-assisted detection of scan chain defects ABIST-assisted detection of scan chain defects

2007-05-29

2007-05-29

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

10728348

ABSTRACT:
An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.

REFERENCES:
patent: 4503386 (1985-03-01), DasGupta et al.
patent: 5313424 (1994-05-01), Adams et al.
patent: 5640402 (1997-06-01), Motika et al.
patent: 5657332 (1997-08-01), Auclair et al.
patent: 5859804 (1999-01-01), Hedberg et al.
patent: 5951703 (1999-09-01), Sprouse et al.
patent: 6278956 (2001-08-01), Leroux et al.
patent: 6308290 (2001-10-01), Forlenza et al.
patent: 6385750 (2002-05-01), Kapur et al.
patent: 6442720 (2002-08-01), Koprowski et al.
patent: 6618826 (2003-09-01), Chen et al.
patent: 6662327 (2003-12-01), Rajski
patent: 6694454 (2004-02-01), Stanley
patent: 6807646 (2004-10-01), Williams et al.
patent: 6950974 (2005-09-01), Wohl et al.
patent: 6993694 (2006-01-01), Kapur et al.
patent: 7058869 (2006-06-01), Abdel-Hafez et al.
patent: 2002/0125907 (2002-09-01), Kurtulik et al.
patent: 2003/0131294 (2003-07-01), Motika et al.
patent: 2004/0003329 (2004-01-01), Cote et al.
patent: 62195169 (1987-08-01), None
patent: 06230075 (1994-08-01), None
Gate Level Fault Diagnosis in Scan Based BIST by Bayraktaroglu et al Proceedings of the 2002 Design automation and test in Europe Conference 1530-1591/02 IEEE.
R. W. Basset et al., “Boundary-Scan Design Principles for Efficient LSSD ASIC Testing,” IBM J. Res. Develop., vol. 34, No. 2/3, Mar./May 1990, pp. 339-354.
Guo et al., “A Technique for Fault Diagnosis of Defects in Scan Chains”, IEEE, paper 10.2, 2001, pp. 268-277, USA.
Giuseppe A. Sarrica et al., “Theory and Implementation of LSSD Scan Ring & STUMPS Channel Test and Diagnosis,” Sep. 28-20, 1992; Electronics Manufacturing Technology Symposium, 1992; Thirteenth IEEE/CHMT International, pp. 195-200.

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