AC coupled line testing using boundary scan test methodology

Details AC coupled line testing using boundary scan test methodology AC coupled line testing using boundary scan test methodology

2007-02-06

2007-02-06

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

09834506

ABSTRACT:
Testing AC coupled interconnects using boundary scan test methodology. Specially designed AC boundary scan cells and boundary scan logic are used. These are compatible with IEEE Standard 1149.1 testing. An AC_EXTEST method is used to determine the reliability of the AC coupled interconnections. The method includes preloading the test stimulus, initiating the AC_EXTEST instruction, executing the instruction, transferring the instruction results, and evaluating the results. During the test, the TAP controllers of both the driving and receiving ICs are held in the Run-Test/Idle state for the time required to complete execution of the instruction. During this time, the driving IC is applying the AC test stimulus to the interconnections and the receiving IC is sampling the signal. The test may be repeated with different test data and may be run together with a DC EXTEST method to determine the reliability of both the AC and the DC coupled interconnections independently.

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Lee Whetsel, Adapting JTAG for AC Interconnect Testing, 2003 IEEE pp. 641-650.

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