Scan register and methods of using the same
Scan sequenced power-on initialization
Scan stream sequencing for testing integrated circuits
Scan stream sequencing for testing integrated circuits
Scan string segmentation for digital test compression
Scan string segmentation for digital test compression
Scan structure for CMOS storage elements
Scan structure for improving transition fault coverage and...
Scan test circuit
Scan test circuit and scan test control method
Scan test circuit including a control test mode
Scan test circuit with reset control circuit
Scan test circuit, semiconductor integrated circuit and scan...
Scan test circuitry using a state machine and a limited...
Scan test control method and scan test circuit
Scan test expansion module
Scan test method for providing real time identification of...
Scan test system for semiconductor device
Scan testable circuit arrangement
Scan testable circuit arrangement