Scan test expansion module

Details Scan test expansion module Scan test expansion module

2007-07-03

2007-07-03

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000

Reexamination Certificate

active

11116616

ABSTRACT:
An external scan test module that is adapted to act as an interface between an automated tester and a device under test. The external scan test module includes a scan pattern memory to hold scan patterns for at least one configuration of the device under test. A failure log memory holds failure information for the device under test. A controller sends scan input data to the device under test, receives scan output data from the device under test, and sends and receives signals from the automated tester. An interface receives scan patterns.

REFERENCES:
patent: 6096085 (2000-08-01), Sammelman
patent: 6157200 (2000-12-01), Okayasu
patent: 6256760 (2001-07-01), Carron et al.
patent: 6754868 (2004-06-01), Bristow et al.

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