Scan string segmentation for digital test compression

Details Scan string segmentation for digital test compression Scan string segmentation for digital test compression

2008-05-15

2009-11-17

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

07620865

ABSTRACT:
One may use a new technique to determine the placement of exclusive-ors in each scan string of a chip to achieve improved test vector compression, and one may combine this technique with methods to minimize the overhead of the exclusive-or logic, to eliminate clock enable logic for multiple scan strings, to minimize the changes to existing test logic insertion and scan string reordering, and to minimize the test vector compression computation time.

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patent: 2005/0216805 (2005-09-01), Guettaf

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