System for at-speed automated testing of high serial pin...

System for at-speed automated testing of high serial pin...

System for dynamic re-allocation of test pattern data for...

System for efficient utilization of multiple test systems

System for flexible embedded Boundary Scan testing

System for identifying valid connections between electrical...

System for measuring characteristics of a digital signal

System for performing automatic test pin assignment for a...

System for reducing test data volume in the testing of logic...

System for test data storage reduction

System for testing an integrated circuit using multiple test...

System for testing fast synchronous digital circuits,...

System for testing IC chips selectively with stored or...

System for testing real and simulated versions of an...

System for verifying signal timing accuracy on a digital...

System for verifying the effectiveness of a RAM BIST controller'

System initialization of microcode-based memory built-in...

System level IC testing arrangement and method

System pulse latch and shadow pulse latch coupled to output...

System to reduce programmable range specifications for a...