System for performing automatic test pin assignment for a...

Details System for performing automatic test pin assignment for a... System for performing automatic test pin assignment for a...

2007-10-30

2007-10-30

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

11016192

ABSTRACT:
A tool for facilitating automatic test pin assignment for a programmable platform device including a process for collecting information related to the programmable platform device, a process for automatically initializing a test pin assignment for the programmable platform device, a process configured to receive user specifications for IOs and a process for performing dynamic test pin reassignment in response to the user specifications.

REFERENCES:
patent: 6678645 (2004-01-01), Rajsuman et al.
patent: 6694464 (2004-02-01), Quayle et al.
patent: 7039545 (2006-05-01), Bundy et al.
patent: 7073109 (2006-07-01), Kolman

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