System for at-speed automated testing of high serial pin...

Details System for at-speed automated testing of high serial pin... System for at-speed automated testing of high serial pin...

2008-04-22

2008-04-22

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S755090

Reexamination Certificate

active

07363557

ABSTRACT:
A system performs automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates. The system includes a test head including a device interface board (DIB), the DIB having a device under test holding device for coupling the devices to the DIB. The system also includes a rider board including a multiplexing system coupled to a control system and to the DIB, the rider board being configured to route a serial data test signal having multi-gigabit per second baud rate through one or more of the devices.

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