System pulse latch and shadow pulse latch coupled to output...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S724000, C714S799000, C714S819000, C714S006130, C327S202000, C377S070000

Reexamination Certificate

active

07373572

ABSTRACT:
In one embodiment, an apparatus includes a system pulse latch to generate at least one system latch signal in response to a data input signal and a pulsed system clock signal; a shadow pulse latch to generate at least one shadow latch signal in response to the data input signal and the pulsed system clock signal; and an output joining circuit, coupled to the system pulse latch and the shadow pulse latch, to provide a data output signal in response to the at least one system latch signal and the at least one shadow latch signal.

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Seifert et al., “Radiation-Induced Clock Jitter and Race,” Proceedings of the International Physics Reliability Symposium, IPRS, San Jose, CA, pp. 215-222, Apr. 2005.

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