Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-09-30
2008-08-05
Baker, Stephen M. (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S744000, C714S745000
Reexamination Certificate
active
07409617
ABSTRACT:
An electronic device under test (DUT) responds to a digital input signal by generating a digital DUT output signal conveying a repetitive digital signal pattern. An apparatus for measuring various characteristics of the DUT output signal includes a trigger generator for generating a series of trigger signal edges in response to selected DUT output signal edges occurring during separate repetitions of the digital signal pattern. The trigger generator can be configured to generate each trigger signal edge in response to the same or a different edge of the digital signal pattern. The apparatus determines when a DUT output signal edge occurs by determining when the DUT output signal rises above or falls below adjustable reference voltages. The apparatus alternatively responds to each trigger signal edge by measuring a period between two different edges of the digital signal pattern and or by repetitively sampling the DUT output signal to determine its state.
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Almy Thomas Arthur
Frisch Arnold M.
Baker Stephen M.
Bedell Daniel J.
Credence Systems Corporation
Smith-Hill and Bedell
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