Performance monitoring circuitry for integrated circuits
Performance monitoring system
Performing memory built-in-self-test (MBIST)
Peripheral connector with boundary-scan test function
Peripheral partitioning and tree decomposition for partial scan
Peripheral partitioning and tree decomposition for partial scan
Peripheral partitioning and tree decomposition for partial scan
Permanent failure monitoring in complex systems
Phase shifter with reduced linear dependency
Phase shifter with reduced linear dependency
Physical packaging position information processing system
Pin coupler for an integrated circuit tester
Pipeline circuit with a test circuit with small circuit scale an
Pipeline of additional storage elements to shift...
Pipelined data processor with deterministic signature...
Platform ASIC reliability
Plesiochronous transmit pin with synchronous mode for...
Position independent testing of circuits
Position independent testing of circuits
Position independent testing of circuits