Performing memory built-in-self-test (MBIST)

Details Performing memory built-in-self-test (MBIST) Performing memory built-in-self-test (MBIST)

2005-11-18

2008-09-16

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S736000, C714S030000, C714S718000, C714S719000, C714S720000, C714S734000, C714S735000, C714S738000, C714S741000, C714S742000, C714S743000, C716S030000, C716S030000, C716S030000, C716S030000, C703S022000, C365S201000

Reexamination Certificate

active

07426668

ABSTRACT:
Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.

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