Pin coupler for an integrated circuit tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Reexamination Certificate

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11117968

ABSTRACT:
A coupling unit that couples at least two pins of an ATE (Automated Test Equipment) to a pin of a device under test includes an ATE interface for receiving a plurality of first stimulus signals from selected ATE-pins and/or for sending a plurality of first response signals to the selected ATE-pins, a DUT interface for sending a second stimulus signal to the DUT-pin and/or for receiving a second response signal from the DUT-pin, and a multiplexer circuit for serializing data of the plurality of first stimulus signals into the second stimulus signal and/or a de-multiplexer circuit adapted for parallelizing data of the second response signal into the plurality of first response signals.

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Cai Y. et al. “Digital Serial Communication Device Testing and Its Implications on Automatic Test Equipment Architecture”, Proceedings of the International Test Conference, IEEE US, Oct. 30, 2003, pp. 600-609.
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EP Search Report, Oct. 11, 2004.

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