Phase shifter with reduced linear dependency

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S727000

Reexamination Certificate

active

10911033

ABSTRACT:
A method is disclosed for the automated synthesis of phase shifters. Phase shifters comprise circuits used to remove effects of structural dependencies featured by pseudo-random test pattern generators driving parallel scan chains. Using a concept of duality, the method relates the logical states of linear feedback shift registers (LFSRs) and circuits spacing their inputs to each of the output channels. The method generates a phase shifter network balancing the loads of successive stages of LFSRs and satisfying criteria of reduced linear dependency, channel separation and circuit complexity.

REFERENCES:
patent: 3614400 (1971-10-01), Farnett
patent: 3700869 (1972-10-01), Low et al.
patent: 4161041 (1979-07-01), Butler et al.
patent: 4320509 (1982-03-01), Davidson
patent: 4503537 (1985-03-01), McAnney
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4536881 (1985-08-01), Kasuya
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4687988 (1987-08-01), Eichelberger et al.
patent: 4754215 (1988-06-01), Kawai
patent: 4785410 (1988-11-01), Hamatsu et al.
patent: 4801870 (1989-01-01), Eichelberger et al.
patent: 4860236 (1989-08-01), McLeod et al.
patent: 4959832 (1990-09-01), Bardell, Jr.
patent: 4974184 (1990-11-01), Avra
patent: 5072178 (1991-12-01), Matsumoto
patent: 5090035 (1992-02-01), Murase
patent: 5138619 (1992-08-01), Fasang et al.
patent: 5167034 (1992-11-01), MacLean, Jr. et al.
patent: 5173906 (1992-12-01), Dreibelbis et al.
patent: 5202889 (1993-04-01), Aharon et al.
patent: 5258986 (1993-11-01), Zerbe
patent: 5268949 (1993-12-01), Watanabe et al.
patent: 5301199 (1994-04-01), Ikenaga et al.
patent: 5325367 (1994-06-01), Dekker et al.
patent: 5349587 (1994-09-01), Nadeau-Dostie et al.
patent: 5369648 (1994-11-01), Nelson
patent: 5394405 (1995-02-01), Savir
patent: 5412665 (1995-05-01), Gruodis et al.
patent: 5414716 (1995-05-01), Bershteyn
patent: 5416783 (1995-05-01), Broseghini et al.
patent: 5446683 (1995-08-01), Mullen et al.
patent: 5450414 (1995-09-01), Lin
patent: 5524114 (1996-06-01), Peng
patent: 5533128 (1996-07-01), Vobach
patent: 5574733 (1996-11-01), Kim
patent: 5586125 (1996-12-01), Warner
patent: 5592493 (1997-01-01), Crouch et al.
patent: 5608870 (1997-03-01), Valiant
patent: 5612963 (1997-03-01), Koenemann et al.
patent: 5614838 (1997-03-01), Jaber et al.
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5631913 (1997-05-01), Maeda
patent: 5642362 (1997-06-01), Savir
patent: 5680543 (1997-10-01), Bhawmik
patent: 5694402 (1997-12-01), Butler et al.
patent: 5701308 (1997-12-01), Attaway et al.
patent: 5717701 (1998-02-01), Angelotti et al.
patent: 5717702 (1998-02-01), Stokes et al.
patent: 5719913 (1998-02-01), Maeno
patent: 5748497 (1998-05-01), Scott et al.
patent: 5790562 (1998-08-01), Murray et al.
patent: 5790626 (1998-08-01), Johnson et al.
patent: 5812561 (1998-09-01), Giles et al.
patent: 5831992 (1998-11-01), Wu
patent: 5848198 (1998-12-01), Penn
patent: 5867507 (1999-02-01), Beebe et al.
patent: 5870476 (1999-02-01), Fischer
patent: 5872793 (1999-02-01), Attaway et al.
patent: 5883906 (1999-03-01), Turnquist et al.
patent: 5899961 (1999-05-01), Sundermann
patent: 5905986 (1999-05-01), Rohrbaugh et al.
patent: 5938784 (1999-08-01), Kim
patent: 5974179 (1999-10-01), Caklovic
patent: 5974433 (1999-10-01), Currie
patent: 5983380 (1999-11-01), Motika et al.
patent: 5991898 (1999-11-01), Rajski et al.
patent: 5991909 (1999-11-01), Rajski et al.
patent: 6006349 (1999-12-01), Fujisaki
patent: 6014763 (2000-01-01), Dhong et al.
patent: 6026508 (2000-02-01), Craft
patent: 6041429 (2000-03-01), Koenemann
patent: 6055658 (2000-04-01), Jaber et al.
patent: 6061818 (2000-05-01), Touba et al.
patent: 6072823 (2000-06-01), Takakusaki
patent: 6122761 (2000-09-01), Park
patent: 6141669 (2000-10-01), Carleton
patent: 6158032 (2000-12-01), Currier et al.
patent: 6178532 (2001-01-01), Pierce et al.
patent: 6181164 (2001-01-01), Miller
patent: 6199182 (2001-03-01), Whetsel
patent: 6240432 (2001-05-01), Chuang et al.
patent: 6256759 (2001-07-01), Bhawmik et al.
patent: 6272653 (2001-08-01), Amstutz
patent: 6286119 (2001-09-01), Wu et al.
patent: 6300885 (2001-10-01), Davenport et al.
patent: 6308291 (2001-10-01), Kock et al.
patent: 6327687 (2001-12-01), Rajski et al.
patent: 6330681 (2001-12-01), Cote et al.
patent: 6353842 (2002-03-01), Rajski et al.
patent: 6385750 (2002-05-01), Kapur et al.
patent: 6467058 (2002-10-01), Chakradhar et al.
patent: 6539409 (2003-03-01), Rajski et al.
patent: 6543020 (2003-04-01), Rajski et al.
patent: 6557129 (2003-04-01), Rajski et al.
patent: 6590929 (2003-07-01), Williams
patent: 6684358 (2004-01-01), Rajski et al.
patent: 6708192 (2004-03-01), Rajski et al.
patent: 6763488 (2004-07-01), Whetsel
patent: 6829740 (2004-12-01), Rajski et al.
patent: 2002/0112199 (2002-08-01), Whetsel
patent: 2002/0124217 (2002-09-01), Hiraide et al.
patent: 2003/0120988 (2003-06-01), Rajski et al.
patent: 2003/0131298 (2003-07-01), Rajski et al.
patent: 2004/0128599 (2004-07-01), Rajski et al.
patent: 2004/0172431 (2004-09-01), Rajski et al.
patent: 2005/0097419 (2005-05-01), Rajski et al.
patent: 0372226 (1990-06-01), None
patent: 0438322 (1991-07-01), None
patent: 0481097 (1992-04-01), None
patent: 0 549 949 (1998-03-01), None
patent: 0887930 (1998-12-01), None
patent: 63-286780 (1988-11-01), None
patent: 01-239486 (1989-09-01), None
patent: 03-002579 (1991-01-01), None
patent: 03-012573 (1991-01-01), None
patent: 4-236378 (1992-08-01), None
patent: 05-215816 (1993-08-01), None
patent: 05-249197 (1993-09-01), None
patent: 07-174822 (1995-07-01), None
patent: 08-015382 (1996-01-01), None
patent: 9-130378 (1997-05-01), None
patent: 11-030646 (1999-02-01), None
patent: 11-153655 (1999-06-01), None
patent: 11-264860 (1999-09-01), None
patent: WO91/10182 (1991-07-01), None
patent: WO 01/38889 (2001-05-01), None
patent: WO 01/39254 (2001-05-01), None
Aitken et al., “A Diagnosis Method Using Pseudo-Random Vectors Without Intermediate Signatures,”Proc. ICCAD,pp. 574-577 (1989).
Bardell et al.,Built-In Test for VLSI Pseudorandom Techniques,Chapter 4, “Test Response Compression Techniques,” John Wiley & Sons, Inc., pp. 89-108 (1987).
Benowitz et al., “An Advanced Fault Isolation System for Digital Logic,”IEEE Transactions on Computers,vol. C-24, No. 5, pp. 489-497 (May 1975).
Chakrabarty et al., “Optimal Zero-Aliasing Space Compaction of Test Responses,”IEEE Transactions on Computers,vol. 47, No. 11, pp. 1171-1187 (Nov. 1998).
Chakrabarty, “Zero-Aliasing Space Compaction Using Linear Compactors with Bounded Overhead,”IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,vol. 17, No. 5, pp. 452-457 (May 1998).
Ghosh-Dastidar et al., “Fault Diagnosis in Scan-Based BIST Using Both Time and Space Information,”Proc. ITC,pp. 95-102 (Sep. 1999).
Karpovsky et al., “Board-Level Diagnosis by Signature Analysis,”Proc. ITC,pp. 47-53 (1988).
Karpovsky et al., “Design of Self-Diagnostic Boards by Multiple Signature Analysis,”IEEE Transactions on Computers,vol. 42, No. 9, pp. 1035-1044 (Sep. 1993).
Kundu, “On Diagnosis of Faults in a Scan-Chain,”Proc. VLSI Test Symp.,pp. 303-308 (1993).
Narayanan et al., “An Efficient Scheme to Diagnose Scan Chains,”Proc. ITC,pp. 704-713 (1997).
Rajski et al.,Arithmetic Built-In Self-Test for Embedded Systems,Chapter 3, “Test Response Compaction,” and Chapter 4, “Fault Diagnosis,” Prentice Hall PTR, pp. 87-133 (1998).
Rajski et al., “Diagnosis of Scan Cells in BIST Environment,”IEEE Transactions on Computers,vol. 48, No. 7, pp. 724-731 (Jul. 1999).
Saluja et al., “Testing Computer Hardware through Data Compression in Space and Time,”Proc. ITC,pp. 83-88 (1983).
Wu et al., “Scan-Based BIST Fault Diagnosis,”IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,vol. 18, No. 2, pp. 203-211 (Feb. 1999).
Lew Yan Voon et al., “BIST Linear Generator based on Complemented

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Phase shifter with reduced linear dependency does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Phase shifter with reduced linear dependency, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase shifter with reduced linear dependency will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3860550

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.