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Methods and circuits for testing programmable logic

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods and computer program products for debugging...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods and devices for unwinding stack of frozen program and fo

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods and systems for semiconductor defect detection

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods and systems for testing communications network...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for analyzing scan chains, and for determining...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for debugging scan testing failures of integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for debugging scan testing failures of integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for distributing programs for generating test data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for distributing programs for generating test data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods for using defective programmable logic devices by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of reducing the susceptibility of PLD designs to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of resource optimization in programmable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of testing a digital frequency synthesizer in a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of testing a digital frequency synthesizer in a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of testing a user design in a programmable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Methods of testing interconnect lines in programmable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Microcomputer

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Microcontroller for logic built-in self test (LBIST)

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Microcontroller having special mode enable detection circuitry a

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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