Methods of reducing the susceptibility of PLD designs to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C326S038000

Reexamination Certificate

active

07111215

ABSTRACT:
Methods of implementing designs in programmable logic devices (PLDs) to reduce susceptibility to single-event upsets (SEUs) by taking advantage of the fact that most PLD designs leave many routing resources unused. The unused routing resources can be used to provide duplicate routing paths between source and destination of signals in the design. The duplicate paths are selected such that an SEU affecting one of the duplicate paths simply switches the signal between the two paths. Thus, if one path is disabled due to an SEU, the other path can still provide the necessary connection, and the functionality of the design is unaffected. The methods can be applied, for example, to routing software for field programmable gate arrays (FPGAs) having programmable routing multiplexers controlled by static RAM-based configuration memory cells.

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U.S. Appl. No. 09/783,821, filed Feb. 14, 2001, Carmichael et al.
Phil Brinkley, Carl Carmichael; XAPP181 (v1.0); “SEU Mitigation Design Techniques for the XQR4000XL”; Mar. 15, 2000; available from Xilinx, Inc., 2100 Logic Drive, San Jose, CA 95124 or http//www.xilinx.com.; pp. 1-14.

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