Method for testing integrated circuits with an automatic...

Method for testing integrated circuits with memory element...

Method for testing integrated logic circuits

Method for testing non-deterministic device data

Method for testing path delay faults in sequential logic circuit

Method for testing reflection LCD projector and display...

Method for testing semiconductor chips and semiconductor device

Method for testing semiconductor chips by means of bit masks

Method for testing semiconductor chips using register sets

Method for testing semiconductor integrated circuit and...

Method for testing the error ratio of a device

Method for the testing of electronic components

Method for translating physical cell-coordinates of a memory...

Method for verifying the accuracy of bit-map memory test...

Method of acquiring scan chain reorder information, and...

Method of an apparatus for designing test facile...

Method of analyzing logic circuit test points, apparatus for ana

Method of and apparatus for testing a serial...

Method of and apparatus for timing verification of LSI test...

Method of and device for getting internal bus information