Method of acquiring scan chain reorder information, and...

Details Method of acquiring scan chain reorder information, and... Method of acquiring scan chain reorder information, and...

2005-04-05

2005-04-05

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C716S030000, C716S030000

Reexamination Certificate

active

06877120

ABSTRACT:
The method of acquiring scan chain reorder information performs scan composition on the basis of a net list before the scan composition and acquires two or more pieces of information from a group consisting of an information which defines a start point and an end point of the scan chain, an information which defines an order of cells on the scan chain, and a unique name and a terminal name of each cell, an information which defines a clock domain and a polarity of a scan flip-flop on the scan chain, and an information which defines scan chain reorder enabling/disabling information.

REFERENCES:
patent: 5748497 (1998-05-01), Scott et al.
patent: 6256770 (2001-07-01), Pierce et al.
patent: 6405355 (2002-06-01), Duggirala et al.
patent: 10-198717 (1998-07-01), None
patent: 11-203105 (1999-07-01), None
patent: 2000-55986 (2000-02-01), None
patent: 2000-137741 (2000-05-01), None

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