Method for performing testing of a simulated storage device...

Method for powering-up a microprocessor under debugger control

Method for programming and/or testing for correct...

Method for providing bitwise constraints for test generation

Method for providing bitwise constraints for test generation

Method for providing user definable algorithms in memory BIST

Method for quality and reliability assurance testing of...

Method for race prevention and a device having race...

Method for reducing switching activity during a scan...

Method for remotely testing microelectronic device over the...

Method for scan controlled sequential sampling of analog...

Method for scan testing and clocking dynamic domino circuits...

Method for scan testing of digital circuit, digital circuit...

Method for segmenting BIST functionality in an embedded...

Method for selecting operation cycles of a semiconductor IC for

Method for self-testing integrated circuits

Method for separating shift and scan paths on scan-only,...

Method for state-based oriented testing

Method for supervising parallel processes

Method for testing a circuit unit to be tested and test...