Method for providing bitwise constraints for test generation

Details Method for providing bitwise constraints for test generation Method for providing bitwise constraints for test generation

2004-12-20

2009-11-03

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S735000

Reexamination Certificate

active

07613973

ABSTRACT:
A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly “solve” the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. The language structure is particularly suitable for such operators as “[: ]”, “|”, “&”, “^”, “˜”, “>>” and “<<”.

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