IEEE 1149.1 and P1500 test interfaces combined circuits and...
IEEE Std. 1149.4 compatible analog BIST methodology
Image data test unit, image apparatus having the same, and...
Immunity evaluation method and apparatus for electronic...
Implementation of an assertion check in ATPG models
Implementation of boolean satisfiability with non-chronological
Implementation of signature analysis for analog and mixed...
Implementation of test patterns in automated test equipment
Implementing diagnosis of transitional scan chain defects...
Implementing enhanced array access time tracking with logic...
Implementing enhanced LBIST testing of paths including arrays
Implementing isolation of VLSI scan chain using ABIST test...
In situ processor margin testing
In system diagnostics through scan matrix
In-chip monitoring system to monitor input/output of...
In-system programmable flash memory device with trigger...
Increasing the effectiveness of error correction codes and...
Increasing the effectiveness of error correction codes and...
Increasing the effectiveness of error correction codes and...
Initial stage of a multi-stage algorithmic pattern generator...