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Method and apparatus for managing testing in a production flow

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for maximizing and managing test coverage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for maximizing test coverage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for measuring crosstalk on a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for measuring duty cycle distortion on...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for measuring group delay of a device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for measuring switching noise in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for monitoring and controlling boundary...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for multi-level scan compression

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for on-chip monitoring of integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for operating a system to test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for operating on a memory unit via a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for optimized parallel testing and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for optimized parallel testing and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for partial-scan built-in self test logic

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for partitioning long scan chains in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for performing error checking

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for performing logic built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for performing multi-site integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for performing multi-site integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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