Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-01-02
2007-01-02
Decady, Albert (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C716S030000, C703S019000
Reexamination Certificate
active
10872793
ABSTRACT:
A simultaneous switching noise (SSN) test circuit and method are provided for measuring effects of SSN. Prior to testing for SSN, a signal is applied to the victim signal input pad and the rise and fall time delays associated with the victim signal are measured at the victim signal output pad. Then, one or more aggressor signals are simultaneously applied to respective input pads of one or more respective aggressor signal paths. The rise and fall time delays of the victim signal transmitted by the output pad are then measured and compared to the previously measured rise and fall time delays to determine effects of SSN on the victim signal caused by the aggressor signals.
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Perino Stan
Salcido Manuel
Yoh Gilbert
Avago Technologies General IP ( Singapore) Pte. Ltd.
De'cady Albert
Trimmings John P.
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