Method and apparatus for maximizing and managing test coverage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S742000

Reexamination Certificate

active

10851134

ABSTRACT:
A method and system for managing test generation and examination of test coverage so as to most efficiently obtain maximum coverage during test generation. Therefore, in addition to achieving coverage maximization, the present invention also preferably manages test generation in order to increase the efficiency of testing to obtain such coverage maximization. The present invention also preferably provides tactics and/or strategies for generation as part of such management. Thus, coverage providing by test generation and execution is not only measured, but is also preferably obtained in a more efficient manner by enabling the coverage maximization functions to provide feedback and management to the test generation process.

REFERENCES:
patent: 4937765 (1990-06-01), Shupe et al.
patent: 5202889 (1993-04-01), Aharon et al.
patent: 5450414 (1995-09-01), Lin
patent: 5633812 (1997-05-01), Allen et al.
patent: 5680332 (1997-10-01), Raimi et al.
patent: 5844909 (1998-12-01), Wakui
patent: 5862149 (1999-01-01), Carpenter et al.
patent: 6044214 (2000-03-01), Kimura et al.
patent: 6052809 (2000-04-01), Bowden
patent: 6059451 (2000-05-01), Scott et al.
patent: 6845479 (2005-01-01), Illman
Sneed “State Coverage of Embedded Realtime Programs”, Proc. 2nd Workshop on Software Testing, Verification & Analysis, p. 145, 1998.
Greggain et al. “Fault Grading, a Measure of Logic Simulation Integrity”, Proc. 2nd Annual IEEE ASIC Seminar and Exhibit, p. 9-2.1-9-2.4, Sep. 1989.
Piwowarski et al. “Coverage Measurement Experience During Function Test”, IEEE Proc. 15th Int. Conf. Software Engineering, p. 287-301, 1993.
Moundanos et al. “Abstraction Techniques for Validation Coverage Analysis and Test Generation”, IEEE Transaction on Computers, 47(1): 2-14, 1998.
Debany et al. “Design Verification Using Logic Test”, IEEE, p. 17-24, 1992.
Benjamin et al. “A Study in Coverage-Driven Test Generation”, DAC, p. 970-975, 1999.

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