Field programmable device
File driven mask insertion for automatic test equipment test...
Fingerprinted circuits and methods of making and identifying...
Fixed-logic signal generated in an integrated circuit for...
Fixing functional errors in integrated circuits
Flash memory
Flexible and extensible implementation of sharing test pins...
Flexible memory built-in-self-test (MBIST) method and apparatus
Flexible scan architecture
Flexible test environment for automatic test equipment
Flexible test environment for automatic test equipment
Flip flop circuit and apparatus using a flip flop circuit
Flip flop circuit and apparatus using a flip flop circuit
Flip flop circuit for scan test with two latch circuits
Flip-flop and scan path circuit
Flip-flop circuit for capturing input signals in priority order
Flip-flop, shift register, and scan test circuit
Format control circuit and semiconductor test device
Full scan solution for latched-based design
Full scan solution for latched-based design